【公開日：2025.06.10】【最終更新日：2025.05.20】
課題データ / Project Data
課題番号 / Project Issue Number
24NM0196
利用課題名 / Title
酸化物分散強化(ODS)合金における酸化物粒子によるα-γ相変態遅延の熱力学的研究
利用した実施機関 / Support Institute
物質・材料研究機構 / NIMS
機関外・機関内の利用 / External or Internal Use
外部利用/External Use
技術領域 / Technology Area
【横断技術領域 / Cross-Technology Area】（主 / Main）計測・分析/Advanced Characterization（副 / Sub）-
【重要技術領域 / Important Technology Area】（主 / Main）マルチマテリアル化技術・次世代高分子マテリアル/Multi-material technologies / Next-generation high-molecular materials（副 / Sub）-
キーワード / Keywords
ODS alloy
利用者と利用形態 / User and Support Type
利用者名（課題申請者）/ User Name (Project Applicant)
Li Teng
所属名 / Affiliation
横浜国立大学 理工学府
共同利用者氏名 / Names of Collaborators in Other Institutes Than Hub and Spoke Institutes
ARIM実施機関支援担当者 / Names of Collaborators in The Hub and Spoke Institutes
利用形態 / Support Type
（主 / Main）機器利用/Equipment Utilization（副 / Sub）-
利用した主な設備 / Equipment Used in This Project
NM-513：ピックアップシステム
NM-510：FIB加工装置（JIB-4000）
報告書データ / Report
概要（目的・用途・実施内容）/ Abstract (Aim, Use Applications and Contents)
In my experiment, Focused Ion Beam (FIB) technique was utilized for precise microfabrication and analysis of material samples. First, the sputtering function of FIB was employed to perform micronscale cutting in the target area. Additionally, the deposition function of FIB was used to deposit a protective layer in specific regions to prevent potential damage during subsequent analysis. The entire experimental process demonstrated the multifunctionality and high precision of FIB technique, successfully preparing ultrathin samples required for Transmission Electron Microscopy (TEM) analysis and providing strong support for in-depth investigation of the microstructure and properties of materials.
実験 / Experimental
In the experiment, the Focused Ion Beam (FIB) system NM-510 was utilized to precisely mill a thin specimen measuring approximately 15 micrometers in length, 2 micrometers in thickness, and 4 micrometers in depth from the material sample. Subsequently, the NM-513 Picking Up System was employed to transfer and affix this thin specimen onto a Transmission Electron Microscopy (TEM) grid, facilitating subsequent TEM observation and analysis. This process highlights the high precision and multifunctionality of FIB technology in preparing TEM samples, enabling in-depth investigation of the material's microstructure.
結果と考察 / Results and Discussion
In this experiment, Focused Ion Beam (FIB) technique was employed to prepare Transmission Electron Microscopy (TEM) samples. By optimizing the FIB preparation parameters, high-quality TEM samples were successfully fabricated.
図・表・数式 / Figures, Tables and Equations
surface
cutting process (2)
cutting process (1)
cutting process (3)
その他・特記事項（参考文献・謝辞等） / Remarks(References and Acknowledgements)
口頭発表、ポスター発表および、その他の論文：
Li Teng, 22nd INTERNATIONAL CONFERENCE ON FUSION REACTOR MATERIALS（ICFRM-22）, 2025/9/28-2025/10/3. shizuoka
成果発表・成果利用 / Publication and Patents
論文・プロシーディング（DOIのあるもの） / DOI (Publication and Proceedings)
口頭発表、ポスター発表および、その他の論文 / Oral Presentations etc.
特許 / Patents
特許出願件数 / Number of Patent Applications：1件
特許登録件数 / Number of Registered Patents：1件